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Scanning probe microscopy
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231	Characterization of Materials with a Combined AFM/ Raman Microscope Marko Surtchev1, Sergei Magonov1 and Mark Wall2 1 NT-MDT America, Tempe, AZ U.S.A. 2 Add to Reading List Source URL: www.ntmdt.com Language: English - Date: 2015-02-19 03:40:30 Scanning probe microscopy Spectroscopy Microscopy Intermolecular forces Raman spectroscopy Laboratory techniques Chemical imaging Raman scattering Atomic force microscopy Scientific method Science Chemistry
232	HybriD™ Mode Atomic Force Microscopy (AFM) from NT-MDT - An Interview with Sergei Magonov HybriD™ Mode Atomic Force Microscopy (AFM) from NT-MDT - An Interview with Sergei Magonov Interview by Will Soutter Add to Reading List Source URL: www.ntmdt.com Language: English - Date: 2013-08-08 00:48:22 Chemistry Atomic force microscopy Microscopy Near-field scanning optical microscope Nanotechnology Nanosensors NanoWorld Scanning probe microscopy Science Scientific method
233	AFM + Raman Microscopy + SNOM + Tip-Enhanced Raman: Instrumentation and Applications P. Dorozhkin,* E. Kuznetsov, A. Schokin, S. Timofeev, and V. Bykov NT-MDT Co., Build. 100, Zelenograd Moscow, [removed]Russia * dorozhkin Add to Reading List Source URL: www.ntmdt.com Language: English - Date: 2012-07-13 02:47:38 Scientific method Microscopy Near-field scanning optical microscope Raman spectroscopy Atomic force microscopy Microscope Optical microscope Magnetic force microscope Graphene Science Scanning probe microscopy Chemistry
234	AFM for biological applications LIFE setup and measuring head lifting mechanism Development of an AFM for biological applications is always a tricky problem because it requires AFM integration with an Inverted Light Mi Add to Reading List Source URL: www.ntmdt.com Language: English - Date: 2012-12-13 04:14:09 Microbiology Microscopy Magnetic force microscope Microscope Optical microscope Kelvin probe force microscope Atomic force microscopy Vibrational analysis with scanning probe microscopy Scanning probe microscopy Science Chemistry
235	Single-Pass Measurements in Atomic Force Microscopy Single-Pass Measurements in Atomic Force Microscopy: Kelvin Force Microscopy and Local Dielectric Studies NT-MDT Development Inc. 416 W. Warner Rd. Tempe AZ USA Add to Reading List Source URL: www.ntmdt.com Language: English - Date: 2013-10-09 06:55:25 Scientific method Atomic force microscopy AFM probe Microscopy Measuring instrument Kelvin probe force microscope Magnetic force microscope Scanning probe microscopy Science Chemistry
236	2.5 Ultimate resolution in the contact mode[removed]The effect of elastic deformations The AFM technique accuracy is limited by elastic deformations which modify a sample Add to Reading List Source URL: www.ntmdt.com Language: English - Date: 2008-01-29 12:03:00 Area Surface area Curvature Sphere Cone Angular resolution Atomic force microscopy Geometry Scanning probe microscopy Surfaces
237	MICROSCOPY RESEARCH AND TECHNIQUE 73:973–[removed]Combination of Atomic Force Microscopy and Principal Component Analysis As a General Method for Direct Recognition of Functional and Structural Domains in Nanonocomp Add to Reading List Source URL: profs.sci.univr.it Language: English - Date: 2012-06-26 09:41:00 Chemistry Scattering Intermolecular forces Spectroscopy Atomic force microscopy Microscopy Principal component analysis Force spectroscopy Resonance Scanning probe microscopy Science Scientific method
238	SCANNING MICROSCOPIES• Call for Papers Submit Abstracts by 13 April 2015 Add to Reading List Source URL: spie.org Language: English - Date: 2015-04-20 12:30:20 Microscopy SPIE Electron microscope Microscope Scanning probe microscopy Optical microscope Characterization Nanolithography Atomic force microscopy Science Scientific method Chemistry
239	Single-Pass Measurements in Atomic Force Microscopy Single-Pass Measurements in Atomic Force Microscopy: Kelvin Force Microscopy and Local Dielectric Studies NT-MDT Development Inc. 416 W. Warner Rd. Tempe AZ USA Add to Reading List Source URL: ntmdt.com Language: English - Date: 2013-10-09 06:55:25 Scientific method Atomic force microscopy AFM probe Microscopy Measuring instrument Kelvin probe force microscope Magnetic force microscope Scanning probe microscopy Science Chemistry
240	Chapter 6: Materials Protection and Surface Technology Unique Test Facilities Electron microscope (ESEM) with integrated atomic force microscope (AFM) Keywords Add to Reading List Source URL: www.bam.de Language: English - Date: 2015-02-04 09:11:40 Microscopy Scanning probe microscopy Nanotechnology Microscope Atomic force microscopy Environmental scanning electron microscope Scanning electron microscope Electron microscope Optical microscope Scientific method Science Electron microscopy

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